Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Zhen Chen*, Matthew Weyland, Peter A. Ercius, Jim Ciston, Changxi Zheng, Michael S. Fuhrer, Adrian J. D'Alfonso, Leslie J. Allen, Scott D. Findlay

2016 Ultramicroscopy 169, 107
Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Research Topics

Diffractive Imaging Electron Microscopy